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Automated parameter group test application for intelligent I/O device-driver module

IP.com Disclosure Number: IPCOM000004695D
Publication Date: 2001-Apr-12
Document File: 2 page(s) / 20K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a software implementation for an automated parameter group test application for an intelligent I/O device-driver module. Benefits include parameter modification by group, standardized test cases by group, and automated testing from the Host using standard messaging

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Automated parameter group test application for intelligent I/O device-driver module

Disclosed is a software implementation for an automated parameter group test application for an intelligent I/O device-driver module. Benefits include parameter modification by group, standardized test cases by group, and automated testing from the Host using standard messaging.

The application is intended to run on a platform that hosts I/O devices. The application may be implemented as a dynamic link library or as a standalone application. A functional flowchart is contained in Figure 1. Input consists of the basic parameters describing the parameter groups for a given I/O device driver module, including:

List of parameter group numbers for the device driver

Target ID for the device driver

List of field count for each parameter group

List of field types for each parameter group scalar/table)

List of read write status for each field of the parameter groups

The application determines all field sizes for the parameter groups of the device driver module. Based on the read/write capability of each field, the application determines the type of tests to perform. The application then writes a predetermined set of values to each read/write field, which returns a successful status and value. The results indicate that the device-driver module successfully implements the given field.

All read only fields are read, written to, and read again to verify that the device driver module implements the field correctly.

The test application accesses the I/O device-driver module using the standard I/O host-to-target software application programming interface that exists for the platform. The application then generates a report of each test run that includes the following results:

Pass or fail

Group number

Field number

Values, as appropriate

The Intelligent I/O Architecture Specification itemizes the requirements for the device-driver module. Parameters must be modifiable by parameter groups. They must be available to a Host application using standard I/O message passing. All the parameter groups' fields must be tested from the Host platform to uncover bugs and ensure correct implementation of each field in the device driver. The disclosed application automates this time consuming process and eliminates the need to identify test cases because they are standardized and provided by the application.

Fig. 1

Disclosed anonymously