Dismiss
InnovationQ will be updated on Sunday, Oct. 22, from 10am ET - noon. You may experience brief service interruptions during that time.
Browse Prior Art Database

FLEXIBLE DOCKING INTERFACE FOR INTEGRATED CIRCUIT TESTERS AND HANDLERS

IP.com Disclosure Number: IPCOM000005714D
Original Publication Date: 1988-Oct-01
Included in the Prior Art Database: 2001-Oct-30
Document File: 2 page(s) / 109K

Publishing Venue

Motorola

Related People

Bobby W. Formsby: AUTHOR [+4]

Abstract

Integrated circuit testers and handlers must be mechanically and electrically interfaced in order to per- form their intended functions. The handler presents integrated circuits to a test site and removes tested parts therefrom to an appropriate bin or storage area. The tester performs electrical tests on the part, usually referred to as the device under test, or DUT, which currently occupies the test sight.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 50% of the total text.

Page 1 of 2

m MOTOROLA Technical Developments October 1988

FLEXIBLE DOCKING INTERFACE FOR INTEGRATED CIRCUIT TESTERS AND HANDLERS

by Bobby W. Formsby, Bruce Wilks, Kenneth J. Long and Kent Blumenshine

   Integrated circuit testers and handlers must be mechanically and electrically interfaced in order to per- form their intended functions. The handler presents integrated circuits to a test site and removes tested parts therefrom to an appropriate bin or storage area. The tester performs electrical tests on the part, usually referred to as the device under test, or DUT, which currently occupies the test sight.

The disclosed apparatus provides for rapid and reliable docking of the two systems mechanically and also provides a reliable and high quality electrical interface.

   A plurality of electrical cables, preferably coaxial cables, are connected 20 to a tester board 21. These cables are brought together in a central area into a bundle and are bound together by a strain relief apparatus 22. Cables 20, board 21 and strain relief apparatus 22 are enclosed by a metal cover23. After leaving strain relief apparatus 22, the cable bundle passes through an opening in cover 23 and into a first metal sleeve 24, which is fixedly mounted to cover 23.

   A second metal sleeve 25 is approximately coaxial with first metal sleeve 24 and the two metal sleeves are engaged in a telescoping fashion to form a generally tubular enclosure surrounding the cable bundle. The second metal sleeve is fixedly mounted to a metal shroud 26. A loadboard, or printed circuit interface board, is fixedly mounted within shroud 26 and cables 20 are electrically connected to loadboard 27. A pogo pin ring 28 is mechanically mounted to loadboard 27 and the in-board ends of each of the pogo pins is electrically con- nected to loadboard 2%

   S slip ring carrier 30 is fixedly mounted to shroud 26 around the periphery thereof. Slip ring carrier 30 carries a slip ring 31 rotatably mounted therewithin. A locking lever 32 is fixed to slip ring 31 and serves to allow an operator to rotate slip ring 31 within slip ring carrier 30.

   The entire apparatus described up to this point is mounted to the integrated circuit tester. The telescoping nature of slee...