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EFFICIENT AND COMPREHENSIVE DATA RETENTION TEST FOR CIRCUITS MADE FROM A MODULE LIBRARY

IP.com Disclosure Number: IPCOM000006586D
Original Publication Date: 1992-Aug-01
Included in the Prior Art Database: 2002-Jan-16
Document File: 1 page(s) / 62K

Publishing Venue

Motorola

Related People

David M. Menard: AUTHOR [+2]

Abstract

The MC68340 is a 32-bit integrated processor unit with peripheral subsystems. The MC68340 is a mem- ber of the M68300 family of modular devices featuring fully static, high-speed HCMOS technology. It features a dual channel Direct Memory Access (DMA) control- ler, a dual channel serial communications module, and two timer modules. Additional members of the M68300 family can be easily created by selecting from a module library.

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MOTOROLA INC. Technical Developments Volume 16 August 1992

EFFICIENT AND COMPREHENSIVE DATA RETENTION TEST FOR CIRCUITS MADE FROM A MODULE LIBRARY

by David M. Menard, Grady L. Giles

ENVIRONMENT:

  The MC68340 is a 32-bit integrated processor unit with peripheral subsystems. The MC68340 is a mem- ber of the M68300 family of modular devices featuring fully static, high-speed HCMOS technology. It features a dual channel Direct Memory Access (DMA) control- ler, a dual channel serial communications module, and two timer modules. Additional members of the M68300 family can be easily created by selecting from a module library.

  Each peripheral module incorporates an independ- ent scan path which includes all the module's memory elements in one shift register. Each of these module's scan path shi out port is coupled to a common wire- ANDing (precharge) signal.

WHAT ARE THE PROBLEMS SOLVED BY THIS DEVELOPMENT?

  One of the production tests for the MC68340 is to test whether or not the part is truly static. This test can be realized using the scan logic of the modules. A typi- cal test would be executed as follows:

1) Put a module in scan mode.
2) Scan all l's into the module.
3) Wait
4) Scan out of the module (any 0 indicates a failure).
5) Scan all O's into the module.
6) Wait
7) Scan out of the module (any 1 indicates a failure).

  Since production test time is expensive, if all mod- ules could be tested in parallel, test time would he minimized.

  Without any additional log...