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NON-DESTRUCTIVE RF TEST OF SURFACE MOUNT DEVICES BY PROBING

IP.com Disclosure Number: IPCOM000006643D
Original Publication Date: 1992-Dec-01
Included in the Prior Art Database: 2002-Jan-18
Document File: 1 page(s) / 43K

Publishing Venue

Motorola

Related People

S. R. Stringer: AUTHOR [+3]

Abstract

This publication describes a methodology for per- forming a non-des~ctive/non-abrasive RF test of SMDs (Surface Mount devices) by probing. The method is an inexpensive solution intermediary between manual testing and use of newer, more expensive high speed testers. In either manual testing or high speed automated testers, the product tested is subjected to additional handling operations as the product is delivered from a carrier to the test head and back to the carrier.

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INC. Technical Developments Volume 17 December 1992

NON-DESTRUCTIVE RF TEST OF SURFACE MOUNT DEVICES BY PROBING

by S. R. Stringer, T M. Divine and F. Y. Cho

  This publication describes a methodology for per- forming a non-des~ctive/non-abrasive RF test of SMDs (Surface Mount devices) by probing. The method is an inexpensive solution intermediary between manual testing and use of newer, more expensive high speed testers. In either manual testing or high speed automated testers, the product tested is subjected to additional handling operations as the product is delivered from a carrier to the test head and back to the carrier.

  The use of a wafer prober/RF probe card/prober software driver constitutes a method by which product can receive full electrical testing within the original car-

rier. Dimensioning information for each carrier as well as test requirements for each product type are stored by the software. The result is a generic test capability which accommodates any number of parts per carrier and involves no individual handling of the devices.

  The test sequence involves placement of the prod- uct carrier onto the prober chuck. The chuck is then indexed such that each device, in the carrier, is delivered to the test probe card. Parts which fail at test receive an ink dot. After all tests are performed, the carrier is returned to the home position and test data are stored on disk.

0 Motorola. 1°C. ,992

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