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Method for enhancement of cracks in organic materials for x-ray inspection

IP.com Disclosure Number: IPCOM000007800D
Publication Date: 2002-Apr-24
Document File: 2 page(s) / 146K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for enhancement of cracks in organic materials for x-ray inspection. Benefits include improved test environment and improved reliability.

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Method for enhancement of cracks in organic materials for x-ray inspection

Disclosed is a method for enhancement of cracks in organic materials for x-ray inspection. Benefits include improved test environment and improved reliability.

Background

              Detecting cracks in organic materials using X-ray inspection and contrast enhancement medium is problematic (see Figure 1, X-ray image without iodine). Conventionally, cross-sectioning is the only alternative. It is a destructive process and sometimes destroys evidence of the failure. Only one plane of the crack can be imaged at a time. Sequential cross-sections and imaging can be performed but are time consuming.

General description

              The disclosed method is a process by which a defect in a package is filled with a material that has a high atomic number. The material makes X-ray detection of the defect possible. This process can be used for nondestructive detection and 3-D imaging of cracks and defects in an organic material-based integrated circuit package.

      The key elements of the method include:

§         Low viscosity, low surface-tension solution containing an element with a high atomic number, such as iodine, is used.

§         Solution is injected into the crack or defect by applying a vacuum or pressure.

§         Excessive solution is removed and package is dried.

§         X-ray methods are used to image the solution in the cracks to determine the geometry of the cracks or to detect cracks that are not visible.

Advantages

      The disclosed method provides advan...