Browse Prior Art Database

SMART TESTING USING THE BDM FUNCTION OF THE MC 68XXX

IP.com Disclosure Number: IPCOM000008447D
Original Publication Date: 1997-Dec-01
Included in the Prior Art Database: 2002-Jun-14
Document File: 2 page(s) / 84K

Publishing Venue

Motorola

Related People

C. Zizzo: AUTHOR [+2]

Abstract

New generations of products are getting smaller and smaller and there is not enough space on Printed Circuit Boards to accommodate conventional test pad nodes which are needed by In Circuit Test Equipment (ICT) to fully test the circuits. Also application specific integrated circuits (ASlCs) are far more difficult to test using conventional "Analog" ICT equipment due to the high integration and functions of these ASICs. Up to now the test coverage using ICT equipment has been directly related to the number of test pads available. With even higher product integration and the emergence of Ceramic hybrid products the full test access is getting harder to achieve. Also the digital compo- nent of the ASICs cannot be tested using standard analogue ICT equipment.

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MOTOROLA Technical Developments

SMART TESTING USING THE BDM FUNCTION OF THE MC 68XXX

by C. Zizzo and B. Hall

BACKGROUND

  New generations of products are getting smaller and smaller and there is not enough space on Printed Circuit Boards to accommodate conventional test pad nodes which are needed by In Circuit Test Equipment (ICT) to fully test the circuits. Also application specific integrated circuits (ASlCs) are far more difficult to test using conventional "Analog" ICT equipment due to the high integration and functions of these ASICs. Up to now the test coverage using ICT equipment has been directly related to the number of test pads available. With even higher product integration and the emergence of Ceramic hybrid products the full test access is getting harder to achieve. Also the digital compo- nent of the ASICs cannot be tested using standard analogue ICT equipment.

NEW ELEMENTS

  The new Motorola 68xxx family of micro- processors have a Background Debug Mode (BDM) function for software development, integration and debugging. Using this function it is possible, with just a few test points at the ICT level, to test all digital blocks and digital-analog ICs. This by itself provides a good test coverage, but when linked with a standard analog ICT machine the full test cover-

age of a product can be achieved with just a few test points using existing equipment and with the

integration of a BDM Test Controller in the ICT equipment. Therefore no significant new investment is required to implement the concept here illustrated.

ADVANTAGE

  Full ICT test coverag...