Browse Prior Art Database

Method for multiple device interface testing using a single device

IP.com Disclosure Number: IPCOM000010054D
Publication Date: 2002-Oct-16
Document File: 3 page(s) / 83K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for multiple-device interface testing using a single device. Benefits include improved functionality and an improved test environment.

This text was extracted from a Microsoft Word document.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 65% of the total text.

Method for multiple device interface testing using a single device

Disclosed is a method for multiple-device interface testing using a single device. Benefits include improved functionality and an improved test environment.

Background

              A memory controller for multiple standard random-access memory (SRAM), flash, or other nonvolatile random-access memory (NVRAM) devices generally drives individual chip select signals to each device or bank of devices (see Figure 1). A system that supports multiple devices may have many chip selects. Validating this type of controller requires a device on each chip select.

Description

              The disclosed method is multiple-device interface testing using a single device. The logic is intended for support validation testing but is not limited to this application. The method includes a special bit that enables a single chip select to represent a logical OR of other chips selects so that it is active with any other chip select. This enables a single device to be used during testing, reducing the total cost of parts for validation and silicon surface area (and its cost) on the test board.

              For example, low true logic is used with a four chip select configuration (see Figure 2):

CS0# = CS0# and CS1# and CS2# and CS3#

              The validation implementation depends on the testing requirements and setup. One option is to test each device memory region individually. In this case, the regions all overlap so that only one can be tes...