Browse Prior Art Database

Accelarate Scanning speed of ArrayTester with FIFO and Multi-thread

IP.com Disclosure Number: IPCOM000010376D
Original Publication Date: 2002-Nov-22
Included in the Prior Art Database: 2002-Nov-22
Document File: 3 page(s) / 87K

Publishing Venue

IBM

Abstract

Disclosed is a system with new idea for data transfer in ArrayTester that is used for TFT-Array manufacturing, and used for detection defects and measuring TFT characteristics.

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Accelarate Scanning speed of ArrayTester with FIFO and Multi-thread

Fig-1 shows the current data transfer system, which system require 2 steps in data transfer, one is SENSE-CARD to IO-CARD, other is IO-CARD to PC. PC has to wait sense, sample/hold and data transfer from SENSE-CARD to IO-CARD. This invention is to provide asyncronus data transfer between SENSE-CARD to IO-CARD and IO-CARD to PC. Fig-2 shows the new system of this idea. FIFO makes asynchronus transfer possible. Fig-3 shows the difference with current method and new idea. These advantage reduced tranfer time and result in manufacturing throughput up.

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Disclosed by International Business Machines Corporation

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