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Method for testing the susceptibility of wireless components to EMI

IP.com Disclosure Number: IPCOM000011734D
Publication Date: 2003-Mar-12
Document File: 6 page(s) / 104K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for testing the susceptibility of wireless components to electromagnetic interference (EMI). Benefits include an improved test environment.

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Method for testing the susceptibility of wireless components to EMI

Disclosed is a method for testing the susceptibility of wireless components to electromagnetic interference (EMI). Benefits include an improved test environment.

Background

        � � � � � The use of wireless devices such as cell phones, pagers, and local area network (LAN) devices are becoming increasingly prevalent on high volume manufacturing (HVM) test floors to increase manufacturing efficiency. These devices are transmitters that operate in the same frequency ranges as many wireless, radio frequency (RF) communications components (die or packaged) being tested. A 5.8-GHz LAN on the test floor could interfere with the testing of a 5.8-GHz transceiver. The impact of wireless devices on products under test must be measured.

        � � � � � Conventional EMI testing methods are designed for final, system level product configurations. The tests determine if the production devices meet governmental regulatory standards. No such requirements exist for component-level devices. As a result, no method detects any component susceptibility to frequencies during manufacturing.

        � � � � � Conventional EMI testing is typically performed in a controlled environment, such as an anechoic chamber. This testing is costly and requires significant space on the test floor or lab.

        � � � � � Horn antennas are capable of transmitting and receiving. Their most common use in EMI testing is as receivers for emissions testing of system level products.

General description

        � � � � � The disclosed method tests the susceptibility of wireless components at the wafer or package level to EMI generated by wireless devices commonly used in HVM test facilities. The method uses a horn antenna as a transmitter, providing a low-cost technique for measuring product susceptibility to spurious noise prior to its final form factor.

        � � � � � A sweeper and antennas are used in combination with path loss RF equations to estimate the signal strength received at the device under test (DUT) when signals are mimicked. The tools required include a signal generator and a waveguide horn antenna. The generator produces the signal, and the antenna amplifies and transmits.

        � � � � � The antenna mimics the signals and associated harmonics from common wireless devices to test the EMI susceptibility of component level communications products up to 40 GHz at the wafer and component levels. The use of bench equipment, loss values, and basic wireless equations are combined.

Advantages

        � � � � � The disclosed method provides advantages, including:

•        � � � � Improved test environment due to the simplicity of the method

•        � � � � Improved test environment due to providing the RF test engineer with early indications of any EMI susceptibility at the component level

•        � � � � Improved test environment due to being universal when frequencies are known rather than requiring changes because of location/jurisdiction

•        � � � � Improved cost effecti...