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Method for a countersink-shaped probing test fixture

IP.com Disclosure Number: IPCOM000012348D
Publication Date: 2003-Apr-30
Document File: 2 page(s) / 65K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for a countersink-shaped probing test fixture. Benefits include an improved test environment and improved ease of implementation.

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Method for a countersink-shaped probing test fixture

Disclosed is a method for a countersink-shaped probing test fixture. Benefits include an improved test environment and improved ease of implementation.

Background

              With connector lead testing technology, a limitation exists in detecting leads not seated with pins connected to power nodes and pins shorted to each other under circuitry. One conventional solution detects connector leads (see Figure 1). However, the cost of test fixtures and scan cards continues to rise. An application-specific scan card is required for different connector modules. The library development and model debugging processes continue to require a long time. Maintenance is continually required.

              Another solution is an insulated probe. It detects connector leads that are not seated. However, maintenance is a concern where the insulation layer is easily broken after a few thousand cycles. Additionally, the life cycle of the probe is shorter due to flux that accumulates in the insulation layer with conventional self-cleaning technology.

General description

              The disclosed method is a test fixturing feature that enables the detection of connector leads not seated with pins connected to power nodes and pins shorted to each other under circuitry.

              The key elements of the method include:

•             Fixture top plate through-hole with a countersink-shaped design to block the test probe from direct contact on the connector t...