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Efficient Method For Migrating Test Data From Embedded Macro Pins To Chip Pins

IP.com Disclosure Number: IPCOM000012575D
Original Publication Date: 2003-May-15
Included in the Prior Art Database: 2003-May-15
Document File: 1 page(s) / 21K

Publishing Venue

IBM

Abstract

This concept addresses the problem of testing more than two identical embedded macros simultaneously. The number of chip output pins to be measured is limited to 2 times the number of macro output pins to be measured. By measuring just two pins, the corresponding output pin of all embedded macros can be measured.

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  Efficient Method For Migrating Test Data From Embedded Macro Pins To Chip Pins

  The concept is illustrated in the following diagram. It is assumed that all macros receive the same stimuli (not shown). For each macro output pin that needs to be measured during macro test, two chip pins are allocated. The corresponding output pin of all identical macros is observed at the same two chip pins, as illustrated. A "Measure 0" at the macro output pin is "migrated" to a "Measure 0" at both chip output pins, ZAND and ZOR; if one or both of the pins is measured at 1 (rather than 0), one or more of the embedded macros failed to produce a 0 at its output pin. Similarly, a "Measure 1" at the macro output pin is "migrated" to a "measure 1" at both chip output pins; if one or both of the pins is measured at 0 (rather than 1), one or more of the embedded macros failed to produce a 1 at its output pin. In summary, any miscompare at either chip output, ZAND or ZOR, indicates that one or more of the macros-under-test failed to produce the expected response.

Disclosed by International Business Machines Corporation

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