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High current continuous dummy write (ERP), high current write pre-scan (MFG test)

IP.com Disclosure Number: IPCOM000013803D
Original Publication Date: 2000-Jul-01
Included in the Prior Art Database: 2003-Jun-18
Document File: 1 page(s) / 28K

Publishing Venue

IBM

Abstract

In data error recovery procedure (ERP), high-current continuous dummy write operation for several rotation, is performed at dedicated track to remove dust /stains from head poletip (read write element), that disturbs correct data recovery. High current helps poletip scrubbing by maximized head disk interference. In unit test process (MFG), similar high current write operation is performed for whole surface at normal or at high temperature, to clean up dust /asperity on head and disk, to reduce data error by head disk interference. 1

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  High current continuous dummy write (ERP), high current write pre-scan (MFG test)

    In data error recovery procedure (ERP), high-current continuous dummy write
operation for several rotation, is performed at dedicated track to remove dust
/stains from head poletip (read write element), that disturbs correct data
recovery.

High current helps poletip scrubbing by maximized head disk interference.
In unit test process (MFG), similar high current write operation is performed for
whole surface at normal or at high temperature, to clean up dust /asperity on
head and disk, to reduce data error by head disk interference.

1