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Half contact array testing method for TFT array

IP.com Disclosure Number: IPCOM000013880D
Original Publication Date: 2000-Apr-01
Included in the Prior Art Database: 2003-Jun-18
Document File: 2 page(s) / 53K

Publishing Venue

IBM

Abstract

his article describes a design for testing of TFT arrays in which data lines on a TFT array panel are grouped into odd number data lines and even number data lines and odd or even number data lines are tested at a time. This scheme can reduce investment for testing since the number of contact probes can be halved and test circuits needed for inspection can be reduced.

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Half contact array testing method for TFT array

    his article describes a design for testing of TFT arrays in which data lines on a TFT array panel
are grouped into odd number data lines and even number data lines and odd or even number data lines
are tested at a time. This scheme can reduce investment for testing since the number of contact
probes can be halved and test circuits needed for inspection can be reduced.

First Step:
Probes are brought into contact with odd number data lines. (Figure1) Odd number data lines are
connected to the inspection device by probes.

Input Voff to PAD1. TFTs on odd number data lines become OFF and odd number data lines are separated
from Vhold (GND).

Input Von to PAD2. TFTs on even number data lines become ON and even data number data lines are
connectd to Vhold.

The half contact inspection is electrically eqivalent to the full contact inspection since the even
number data lines are not floating.

Next step:
Probes are brought into contact with even number data lines. (Figure2)
Input Von to PAD1. TFTs on odd number data lines become ON and odd number data lines are connected to
Vhold (GND).

Input Voff to PAD2. TFTs on even number data line become OFF and even number data lines are separated
from Vhold.

In this case,the inspection of even number data lines is possible in the same manner as odd number
data lines.

The size of gate line pads and PAD1-3 are designed to be longer than the pitch between the pads of
data lines.

PAD1

PAD2

Voff

Von

CONTAC...