Browse Prior Art Database

ZERO NET MAGNETIZATION FOR LEAD OVERLAP REGION FOR LEAD OVERLAY HEAD

IP.com Disclosure Number: IPCOM000015139D
Original Publication Date: 2001-Sep-01
Included in the Prior Art Database: 2003-Jun-20
Document File: 1 page(s) / 34K

Publishing Venue

IBM

Abstract

Read track width is defined by high conductivity metal overlaying the GMR sensor for lead overlay type GMR head. The hard bias material stabilizing the sensor still forms the contiguous junction with the sensor. The hard bias location is farther from the track edge defined by leads. The sensor area between the hard bias junction and the lead junction can contribute to broadening of the track width as well as to side reading. Described here is one approach to minimize the track width broadening and side reading effects for lead overlay GMR heads. The approach here utilizes antiparallel coupled free layer sensor, where usually two ferromagnetic thin films are antiparallel coupled by a thin layer of metal-like ruthenium. The difference in thicknesses between the two films determines the net magnetic thickness of the active sensor between the lead defined track width. In the lead overlap region of the sensor, the thicknesses of the two ferromagnets are made more near equal to raise the Hk of the material to stiffen the sensor in the area between the hard bias junction and the leads junction. This siffening reduces the track width broadening and side reading effects. 1

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 1

  ZERO NET MAGNETIZATION FOR LEAD OVERLAP REGION FOR LEAD OVERLAY HEAD

   Read track width is defined by high conductivity metal overlaying the GMR sensor for lead overlay type GMR head. The hard bias material stabilizing the sensor still forms the contiguous junction with the sensor. The hard bias location is farther from the track edge defined by leads. The sensor area between the hard bias junction and the lead junction can contribute to broadening of the track width as well as to side reading. Described here is one approach to minimize the track width broadening and side reading effects for lead overlay GMR heads. The approach here utilizes antiparallel coupled free layer sensor, where usually two ferromagnetic thin films are antiparallel coupled by a thin layer of metal-like ruthenium. The difference in thicknesses between the two films determines the net magnetic thickness of the active sensor between the lead defined track width. In the lead overlap region of the sensor, the thicknesses of the two ferromagnets are made more near equal to raise the Hk of the material to stiffen the sensor in the area between the hard bias junction and the leads junction. This siffening reduces the track width broadening and side reading effects.

1