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Method for an on-die memory store to support components from auxiliary stores

IP.com Disclosure Number: IPCOM000016689D
Publication Date: 2003-Jul-09
Document File: 3 page(s) / 101K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for an on-die memory store to support components from auxiliary stores. Benefits include an improved test environment, an improved development environment, and an improved customer experience.

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Method for an on-die memory store to support components from auxiliary stores

Disclosed is a method for an on-die memory store to support components from auxiliary stores. Benefits include an improved test environment, an improved development environment, and an improved customer experience.

Background

      Conventionally, the creation of prememory modules typically requires a very specific set of criteria to run during the system initialization and is typically written in the native CPU assembly language. This code is generally not portable beyond the specific CPU class for which it was written.         No standard framework and associated cache-as-RAM capability exists. Most testing entails running independent test platform (ITP) scripts and comparing results of the firmware initialization. The conventional ITP-based solution does not scale to the factory or to field deployment. Problems may be masked by subsequent initialization.

      Conventionally, failure before the underlying chipset is ready for integration in a platform is usually announced via simple beeps or 8-bit POST codes. Errors in integrating reference code must also be ascertained through the beeps or POST codes. A more detailed, developer-friendly interface is required.
General description

              The disclosed method is an on-die memory store to support platform-independent testing, diagnostics, and boot-strapping of subsidiary firmware components from auxiliary stores. The

method enables the testing of hardware at the earliest stages of system initialization. In most cases, this testing can take place prior to memory initialization and before very little of the system has been perturbed. This environment enables the use of higher-level programming languages for the creation of test modules, which are very portable.

Advantages

              The disclosed method provides advantages, including:

•             Improved test environment due to having the capability to perform testing/diagnostics on a CPU without having the underlying chipset ready for integration in a platform

•             Improved development environment due to supporting faster development or integration of early platform initialization software by enabling developers to write binary-only variants of test code and the actual initialization modules

•             Improved customer experience due to enabling support by independent hardware...