Browse Prior Art Database

PCI-X Manufacturing Hotplug Riser

IP.com Disclosure Number: IPCOM000018593D
Original Publication Date: 2003-Jul-25
Included in the Prior Art Database: 2003-Jul-25
Document File: 1 page(s) / 46K

Publishing Venue

IBM

Abstract

Solution for testing PCI-X static state bus problems and PCI-X hotplug control circuits in a manufacturing environment.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 58% of the total text.

Page 1 of 1

PCI-X Manufacturing Hotplug Riser

   This is an adaptation of the base function of nodes (PCI) hotplug riser adapted for the PCI-X bus structure. It tests the PCI hotplug function for correct operation as well as detects open and shorted control and data lines. New functions include PCI-X sideband control, PCI/PCI-X clock checking, improved sideband passthrough control.

     The problem was testing PCI-X hotpluggable backplanes in a manufacturing environment. The solution was a electronically controlled load card with pass through. The test is broken up between a static test and a functional IPL. During the functional IPL the Riser-X card is invisible to the system passing all control of the PCI bus to the "golden" IO card installed on top of it. During the static test multiple items happen:

1.) Load/Overload testing - Load resistors are electronically switched into each of the power domains to verify that the slot functions at a nominal load and shuts down under a overload condition.
2.) Term testing - The PCI/PCI-X control lines and high 32 bits of the data bus are checked for proper termination resistors (all nets pulled high) and reports any failing nets.
3.) Park testing - The PCI/PCI-X control lines and high 32 bits of the data bus are checked for proper connection to the Eads/Eads-X module (all nets pulled low) and reports any failing nets.
4.) Sideband testing - The PCI/PCI-X sideband signals are isolated from the "golden" card and can be driven or detected by the R...