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Method for extending stored response tester memory to inject and extract microprocessor state

IP.com Disclosure Number: IPCOM000018667D
Publication Date: 2003-Jul-30
Document File: 2 page(s) / 36K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for extending stored response tester memory to inject and extract microprocessor state. Benefits include improved functionality and an improved test environment.

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Method for extending stored response tester memory to inject and extract microprocessor state

Disclosed is a method for extending stored response tester memory to inject and extract microprocessor state. Benefits include improved functionality and an improved test environment.

Background

        � � � � � Stored-response testers are used to test and debug microprocessors. They apply patterns to the device under test (DUT) and compare its responses with the expected results. Typically, tester memory is very limited. Current generation debug testers are equipped with approximately 1 Mb of pattern memory, which is enough to run only a few milliseconds of code at 1 GHz. Conventionally, no method exists for running tests longer than a couple hundred milliseconds on a stored-response tester.

General description

        � � � � � The disclosed method transfers control back and forth between a tap based hardware debug port (HDP) and the tester. The purpose is to greatly increase the amount of code that can be run on the DUT in the test environment. The key components of the disclosed method include:

•        � � � � A tap based Hardware Debug Port (HDP), which is an application used to debug processors

•        � � � � Stored-response tester

•        � � � � Tap interface

•        � � � � Processor (DUT)

Advantages

        � � � � � The disclosed method provides advantages, including:

•        � � � � Improved functionality due to the improved capability to run long test sequences

•        � � � � Improved test environment due to improved functionality

Detailed description

        � � � � � The disclosed method executes very long test sequences on a stored-response tester (see Figure 1). The method enables the debugging of real-life application failures (failures that take more than a cou...