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Browse Prior Art Database

Method for test tray inserts

IP.com Disclosure Number: IPCOM000019519D
Publication Date: 2003-Sep-17
Document File: 5 page(s) / 296K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for test tray inserts. Benefits include improved reliability and an improved production environment.

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Method for test tray inserts

Disclosed is a method for test tray inserts. Benefits include improved reliability and an improved production environment.

Background

         Test tray inserts for high-volume products of flash memories are common. The latch is the part of insert that securely holds the device in test tray. Its main function is to maintain proper positioning of the device inside the insert during test tray movement from one location to another. Package misplacement can occur when the inserts receive the device from the pick-n-place loader during test tray transfer and when releasing the device to a pick-n-place unloader. The excess part of the latch can abruptly capture the edge of the device, causing severe damage (see Figure 1).

General description

         The disclosed method is a redesign of the latch and the change of the latch position from the Y-axis to the X-axis.

Advantages

         The disclosed method provides advantages, including:

•         Improved reliability due to the reduction of ball-related and package defects

•         Improved production environment due to improved quality and delivery performance through optimized handler machine utilization

•         Improved cost effectiveness due to improved spare consumption on sockets and inserts

Detailed description

         The disclosed method is an upgrade to the latch design. A protruding area is removed to provide more space to the device path and ensure that the latch opens and closes well. Removing the excess part of the latch enables the narrowing of the device path inside the inserts (see Figure 2).

         The disclosed method provides a greater margin for the package to settle into the ledge in case the alignment gradually depreciates in any of the following:

•         Pick-n-place test tray calibration position

•         W-head

•         V-head synchronization

         The disclosed method operates the two latches at the same time (see Figure 3). As long as either of the two latch springs is pushed downward, both latches are completely open. This improvement provides greater settling characteristics during entry and exit o...