Browse Prior Art Database

Unit-Level MEMS Switch for IC

IP.com Disclosure Number: IPCOM000021737D
Publication Date: 2004-Feb-04
Document File: 2 page(s) / 17K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method that uses a MEMS-based switch solution to physically disconnect the IC unit from the power supply line. Benefits include isolating target units from high leakages, thereby restoring the effectiveness of the test

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Unit-Level MEMS Switch for IC

Disclosed is a method that uses a MEMS-based switch solution to physically disconnect the IC unit from the power supply line. Benefits include isolating target units from high leakages, thereby restoring the effectiveness of the test

General Description

Figure 1 shows the disclosed method detecting short and open process defects that are hard to find using other approaches. This solution is not effective with high-count transistor ICs and/or large caches (i.e. leakage problems). The switch helps isolate target units from high leakages. Figure 2 shows how the disclosed method can characterize power consumption at a desired unit level. The disclosed method also enables users to physically disconnect unnecessary units
(in addition to functional disabling by ‘fusing’) in order to reduce power consumption.

Advantages

The following are advantages of the disclosed method:

 

  • Detects hard-to-find short and open process defects
  • Helps isolate target units from high leakages
  • Enables users to physically disconnect unnecessary units

Fig. 1

Fig. 2

Disclosed anonymously