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IMPROVEMENT IN PHOTORECEPTOR CHARGING DEVICE

IP.com Disclosure Number: IPCOM000024891D
Original Publication Date: 1982-Aug-31
Included in the Prior Art Database: 2004-Apr-04
Document File: 2 page(s) / 79K

Publishing Venue

Xerox Disclosure Journal

Abstract

Low voltage charging and/or transfer can be accomplished using a biased conductive element in contact with the paper or the photoreceptor. Such devices are employed in conductive brush transfer and biased roll induction charging. One problem has been to avoid the drop in potential of the entire charging device when one portion of it is inadvertently shorted due to a defect 10 in the photoreceptor 12. If the power supply is not current limited such a drop in potential would not occur, however, the power dissipated in the short will be destructive and aggravate the fault. One solution to the problem is to use a very thin conductive layer 14 as the substrate for the photoreceptor such that an arc tends to burn it away very quickly as indicated at 16.

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Page 1 of 2

XEROX DIXLOSURE JOURNAL

Proposed Classification
U.S. .C1. 355/3CH

Int. CI. G03g 15/00

14

LOG P

v2

16 I4

FIG. I

FIEU

FfG. 2

Volume 7 Number 4 July/August 1982 273

[This page contains 1 picture or other non-text object]

Page 2 of 2

IMPROVEMENT IN PHOTORECEPTOR CHARGING DEVICE (Cont'd)

Low voltage charging and/or transfer can be accomplished using a biased conductive element in contact with the paper or the photoreceptor. Such devices are employed in conductive brush transfer and biased roll induction charging. One problem has been to avoid the drop in potential of the entire charging device when one portion of it is inadvertently shorted due to a defect 10 in the photoreceptor
12. If the power supply is not current limited such a drop in potential would not occur, however, the power dissipated in the short will be destructive and aggravate the fault. One solution to the problem is to use a very thin conductive layer 14 as the substrate for the photoreceptor such that an arc tends to burn it away very quickly as indicated at 16.

This burn out effect is commonly observed around the contacts made to aluminized Mylar. The contacts themselves are too massive to be destroyed but the concentration of current around the perimeter of the contact causes a reduction or oxidation of the aluminum which removes the conductive-coating at that location.

A further advantage may be incorporated in the structure of Figure 1. If the resistance of the thin film substrate is non-ohmic w...