Browse Prior Art Database

POSITIONING OF REFLECTIVE HEIGHT MEASURING SENSORS

IP.com Disclosure Number: IPCOM000026753D
Original Publication Date: 1993-Jun-30
Included in the Prior Art Database: 2004-Apr-06
Document File: 2 page(s) / 109K

Publishing Venue

Xerox Disclosure Journal

Abstract

Systems using laser based sensors to measure height profiles on target objects house a laser light source and a detector array together in one unit. Such two dimensional laser based reflective range sensor systems project a stripe of laser light onto an object which is then reflected onto the detector array. Imaged laser light on the detector array renders a profile which depicts the relative height (or range) of the object for each lateral position (or resolution) along the laser stripe. The lateral position delta X shown in Figure 1, of the reflected light on the detector array is used to calculate the relative height delta Y of the object with respect to the adjacent lateral osition. The

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XEROX DISCLOSURE JOURNAL

POSITIONING OF REFLECTIVE HEIGHT MEASURING SENSORS Mansoor Ghazizadeh
Andrea P. Richardson
Theon Sanders

Proposed Classification

U.S. C1.901/046 Int. C1. B25j 19/00

Y

3w4

t

-6

FIG. 2

XEROX DISCLOSURE JOURNAL - Vol. 18, No. 3 May/June 1993 335

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POSITIONING OF REFLECTIVE HEIGHT MEASURING SENSORS

(Cont'd)

Systems using laser based sensors to measure height profiles on target objects house a laser light source and a detector array together in one unit. Such two dimensional laser based reflective range sensor systems project a stripe of laser light onto an object which is then reflected onto the detector array. Imaged laser light on the detector array renders a profile which depicts the relative height (or range) of the object for each lateral position (or resolution) along the laser stripe. The lateral position delta X shown in Figure 1, of the reflected light on the detector array is used to calculate the relative height delta Y of the object with respect to the adjacent lateral osition. The

angle of incident light on the object and the surface reflectivity characteristics of the object. Measurements taken by the system depend on the image reflection on the sensor array. Reflected light will not be detected on the sensor array if an insufficient amount of light is reflected off an object.

Disclosed is a method to maximize the reflectivity of an object for laser sensor system 2 shown in Figure 1, having laser 3 and sensor 4. Figure 1 shows system 2 measuring two surfaces 5 and 6 along a profile o...