Browse Prior Art Database

System and Component Characterization

IP.com Disclosure Number: IPCOM000026851D
Publication Date: 2004-Apr-06
Document File: 6 page(s) / 635K

Publishing Venue

The IP.com Prior Art Database

Abstract

The testing architecture includes an automated tester that interfaces electrically to a device under test (DUT). More specifically, tester has a hardware interface that is configured to stimulate the inputs of DUT in variable ways, and to receive, measure, and evaluate the resulting outputs of DUT. The tester is configured by way of software to manipulate the hardware interface in order to perform various desired tests and evaluations of DUT, and to record the rsults of those tests. The software is stored on computer-readable media associated with or accessible by tester. When using this architecture, each DUT has a unique ID. The unique ID is stored on the DUT in some way that is readable by tester. If DUT is an IC, for example, the unique ID might be imprinted using fuses. Alternatively, the ID might be stored using some form of non-volatile memory, such as EEPROM. Yet another alternative might be to simply label each DUT with some sort of visible and/or external indicia, such as a machine-readable barcode. In some cases, the ID might even be read from the DUT by a human test supervisor and manually entered into tester. The testing architecture also includes a database that is accessible by tester through a network or some other form of data communications. In some cases, the database might be implemented by or within tester itself. Using this architecture, tester maintains a test history in database corresponding to each DUT. Specific data within database is associated with different unique IDs corresponding to different DUTs. For example, if a particular test is run on a DUT, one or more records are created within database corresponding to the unique ID of that DUT. The records indicate test results and characterization data for that particular DUT. New records or information items are added as new tests and analyses are performed, so that database eventually contains full test and characterization histories for every DUT that has been tested.

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