Browse Prior Art Database

ANALYSIS MODE SELF CALIBRATION

IP.com Disclosure Number: IPCOM000027100D
Original Publication Date: 1995-Apr-30
Included in the Prior Art Database: 2004-Apr-07
Document File: 2 page(s) / 69K

Publishing Venue

Xerox Disclosure Journal

Abstract

Proposed is an analysis mode self calibration routine used in a software algorithm for providin a self calibration of the laser light intensity emitted customer's site by a Service Representative in accordance with the need for installing a new photoreceptor or making changes on optical components. The per unit magnitude of the light energy is measured in Ergs/cm2, at the photoreceptor, by an electrostatic voltmeter. The procedure is given in the following steps:

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XEROX DISCLOSURE JOURNAL

ANALYSIS MODE SELF CALIBRA- TION U.S. C1.355/218 Eugene F. Saltzberg

Proposed Classification Int. C1. G03g 21/00

Proposed is an analysis mode self calibration routine used in a software algorithm for providin a self calibration of the laser light intensity emitted

customer's site by a Service Representative in accordance with the need for installing a new photoreceptor or making changes on optical components. The per unit magnitude of the light energy is measured in Ergs/cm2, at the photoreceptor, by an electrostatic voltmeter. The procedure is given in the following steps:

Set and record ROS exposure reference value to X1*. Measure and record the light intensity value with the electrostatic voltmeter.

Activate analysis mode self calibration. Increase the exposure reference until the light intensity matches the electrostatic voltmeter value recorded in Step 2. Record the exposure reference value as X2.

Deactivate analysis mode self calibration. Set and record exposure reference value to X3*. X3 should not be equal to X1.

Measure and record the light intensity value with the electrostatic voltmeter .

Activate analysis mode self calibration. Increase the exposure reference until the light intensity matches the electrostatic voltmeter value recorded in Step 7. Record the exposure reference value as X4.

Calculate analysis mode self calibration. Analysis mode self calibration is equal to (X3-Xl)/(X4-X2) or 25/(X4-X2)*.

* Optimum values for X1...