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Browse Prior Art Database

Capacitor Automated Stress Test

IP.com Disclosure Number: IPCOM000034425D
Original Publication Date: 1989-Feb-01
Included in the Prior Art Database: 2005-Jan-27
Document File: 2 page(s) / 73K

Publishing Venue

IBM

Related People

Camenga, R: AUTHOR [+2]

Abstract

A majority of electronic device reliability projections are based on data gathered from accelerated stress test programs. The testing system described here accurately determines the time-to-failure of tantalum capacitors. The primary failure mode for tantalum capacitors is one of voltage breakdown resulting in shorts or very low resistance paths appearing across the device. The failure mode in this case is modeled by the Weibel distribution (a log-log plot), and accurate measurement of times to fail are very important. Existing methods for gathering accurate time-to-fail data include, but are not limited to, the following: 1) A strip chart recorder is connected to the device under test (DUT) power supply. (Image Omitted) 2) Lamps connected to the DUTs are photographed by camera.

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Capacitor Automated Stress Test

A majority of electronic device reliability projections are based on data gathered from accelerated stress test programs. The testing system described here accurately determines the time-to-failure of tantalum capacitors. The primary failure mode for tantalum capacitors is one of voltage breakdown resulting in shorts or very low resistance paths appearing across the device. The failure mode in this case is modeled by the Weibel distribution (a log-log plot), and accurate measurement of times to fail are very important. Existing methods for gathering accurate time-to-fail data include, but are not limited to, the following: 1) A strip chart recorder is connected to the device under test (DUT) power supply.

(Image Omitted)

2) Lamps connected to the DUTs are photographed by camera. The capacitor automated stress test here disclosed uses a PC (personal computer) as the "engine" and, by means of the program developed for the test, determines the time-to-fail to a specified resolution. A binary string to collect data is provided rather than the scanning systems previously employed, which require manpower to manually observe and record data. The DUTs are regarded either as good or bad, the binary string being made equal in length to their number.

The PC, at specified points in time, reads the binary string. By the use of Boolean operations and comparisons with previous string readings, both the number of new fails and their identity is learned.

This information, together with environmental da...