Browse Prior Art Database

Fault Simulation of Mixed Technology Cards Using Physical Devices

IP.com Disclosure Number: IPCOM000034479D
Original Publication Date: 1989-Mar-01
Included in the Prior Art Database: 2005-Jan-27
Document File: 1 page(s) / 12K

Publishing Venue

IBM

Related People

Dubler, JF: AUTHOR [+2]

Abstract

Disclosed is a method for performing fault simulation of mixed technology cards containing vendor VLSI components. The objective of such a simulator would be to produce fault-locating diagnostics and a measurement of test effectiveness. Several well-known methods of performing fault simulation utilizing strictly software behaviors are documented in the literature. However, what is missing is a procedure for performing fault simulation utilizing a combination of software behaviors and actual physical devices. What is presented here is a method for performing fault simulation of physical devices and solving the problem of how to propagate faults through a correctly functioning physical device.

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Fault Simulation of Mixed Technology Cards Using Physical Devices

Disclosed is a method for performing fault simulation of mixed technology cards containing vendor VLSI components. The objective of such a simulator would be to produce fault-locating diagnostics and a measurement of test effectiveness. Several well-known methods of performing fault simulation utilizing strictly software behaviors are documented in the literature. However, what is missing is a procedure for performing fault simulation utilizing a combination of software behaviors and actual physical devices. What is presented here is a method for performing fault simulation of physical devices and solving the problem of how to propagate faults through a correctly functioning physical device. The method for performing fault simulation of physical devices consists of: (a) stimulating the physical device with the "good machine" input

values,

(b) recording the "good machine" output responses,

(c) selecting a "fault machine" from the set of "fault machines",

(d) stimulating the physical device with the "fault machine" input

values,

(e) recording the "fault machine" output responses,

(f) comparing the "good machine" output responses to the selected

"fault machine" output responses and propagating the results,

(g) repeating steps (c) to (g) until all necessary "fault

machines" have been processed, and

(h) repeating steps (a) to (g) for each test pattern.

Steps (a) and (d) could be modified to stimulate al...