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Manufacturing Test Mode for a Personal Computer

IP.com Disclosure Number: IPCOM000034869D
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-27
Document File: 2 page(s) / 26K

Publishing Venue

IBM

Related People

Hall, JL: AUTHOR [+3]

Abstract

This article describes a method for personal computer (PC) adapter card hardware itself to provide for a host independent functional testing capability in a manufacturing environment. Manufacturing of adapter cards (e.g., PC feature cards) in high volume creates a need for the capability of testing these adapters for hardware functional integrity without having to mount each adapter in a host box. Adapter hardware can contain the circuitry to provide for a manufacturing test mode (MTM) signal. A functionally invalid combination of some of the I/O channel input signals to the adapter can be used to create a MTM signal. Functionally invalid combination means that the activation of these I/O signals are mutually exclusive during the normal operation of the adapter in its system host box.

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Manufacturing Test Mode for a Personal Computer

This article describes a method for personal computer (PC) adapter card hardware itself to provide for a host independent functional testing capability in a manufacturing environment. Manufacturing of adapter cards (e.g., PC feature cards) in high volume creates a need for the capability of testing these adapters for hardware functional integrity without having to mount each adapter in a host box. Adapter hardware can contain the circuitry to provide for a manufacturing test mode (MTM) signal. A functionally invalid combination of some of the I/O channel input signals to the adapter can be used to create a MTM signal. Functionally invalid combination means that the activation of these I/O signals are mutually exclusive during the normal operation of the adapter in its system host box. This method eliminates the need for a dedicated test signal available at the adapter I/O boundary. The MTM signal can be implemented in a latched or unlatched version, depending upon the adapter design and its manufacturing test requirements and facilities. The MTM unlatched implementation implies that the adapter stays in the manufacturing test mode until the state of at least one of the MTM; however, the inputs can change states with no effect on the adapter test state. A channel reset signal should get activated to bring the adapter with latched MTM out of the test state. For the adapter with the unlatched version the removal of the...