Browse Prior Art Database

Card Functional Self-Test Diagnostic Method

IP.com Disclosure Number: IPCOM000035839D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28
Document File: 2 page(s) / 42K

Publishing Venue

IBM

Related People

O'Dell, JT: AUTHOR [+2]

Abstract

The functional self-test (FST) diagnostic method described in this article provides an effective means of functional diagnosis of populated cards. This method eliminates the need for unique diagnostic tester development for each product card.

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Card Functional Self-Test Diagnostic Method

The functional self-test (FST) diagnostic method described in this article provides an effective means of functional diagnosis of populated cards. This method eliminates the need for unique diagnostic tester development for each product card.

The implementation of this technique requires a PC AT, processor emulators, the functional self-test acquisition and data compression chip (FSTC), the board under test (BUT), a known good board (KGB), the RAS code for the BUT, and the functional diagnostic time domain algorithm.

The PC AT interfaces with the emulators and the FSTCs to control the execution of the RAS code and the subsequent collection of signatures produced by the BUT signal data via the FSTCs. The RAS code is run on the BUT and the KGB. Signatures are collected, stored, and compared for each test net.

Miscompares indicate a defective BUT. The functional diagnostic time domain algorithm is used to isolate to the defective net when miscompares occur. Equivalent signatures indicate that the BUT has passed the tests.

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