Browse Prior Art Database

Functional Diagnostic Time Domain Algorithm

IP.com Disclosure Number: IPCOM000035862D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28
Document File: 2 page(s) / 69K

Publishing Venue

IBM

Related People

Huntington, NL: AUTHOR [+4]

Abstract

This article describes an algorithm which simplifies functional test development.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 2

Functional Diagnostic Time Domain Algorithm

This article describes an algorithm which simplifies functional test development.

Traditional functional testing requires a long test development cycle for each selected product. Software for a functional test of one product will be different for another product. Another difficulty encountered in traditional functional testing is the inability to efficiently diagnose a defect to the source net.

A simple but effective solution is to apply the functional diagnostic time domain algorithm illustrated in Fig. 1 within the functional self test and diagnostic tester illustrated in Fig. 2.

(Image Omitted)

The functional diagnostic time domain algorithm takes a defined number of signatures from both a known good board (KGB) and the board under test (BUT). If an error is detected by the diagnostic program, the algorithm will interval divide the code executed until the error is sufficiently confined for data analysis. This will enable the diagnostic program to easily isolate the defective net. All of this can be accomplished quickly regardless of card under test.

1

Page 2 of 2

2

[This page contains 7 pictures or other non-text objects]