Browse Prior Art Database

Test and Monitor Program for Memory Quality Statistics

IP.com Disclosure Number: IPCOM000036023D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28
Document File: 2 page(s) / 38K

Publishing Venue

IBM

Related People

Michels, H: AUTHOR [+4]

Abstract

A technique commonly used to avoid field replacement of memory cards is to activate spare cells in the case of errors. Spare cells not yet activated in the field account for much unused storage space.

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Test and Monitor Program for Memory Quality Statistics

A technique commonly used to avoid field replacement of memory cards is to activate spare cells in the case of errors. Spare cells not yet activated in the field account for much unused storage space.

The idea is to exploit this hardware for reliability statistics instead of and/or in addition to standard reliability tests in a laboratory environment.

It is suggested that the spare cells be operated under control of what is known as a SCRUB feature which, in the form of a background operation, periodically operates the entire memory parallel to normal processing. The test patterns applied to these spare cells may be similar to those used for laboratory and/or production tests.

The failure statistics of the spare cells may be analyzed on-line by the service processor. This processor is required only in the case of an error and therefore capable of exercising its statistical function parallel to normal processing.

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