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Browse Prior Art Database

Algorithm for Flexible Decision Processing During Test Generation

IP.com Disclosure Number: IPCOM000036357D
Original Publication Date: 1989-Sep-01
Included in the Prior Art Database: 2005-Jan-28
Document File: 4 page(s) / 42K

Publishing Venue

IBM

Related People

Shearon, PC: AUTHOR

Abstract

A method implemented in a test generation computer program for making and remaking decisions during circuit test propagation (fanout) which require different decision information than decisions made and remade during block processing (test, justify, and transmit). The method also allows for introducing new block functions which require additional new decision information. (Image Omitted)

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Algorithm for Flexible Decision Processing During Test Generation

A method implemented in a test generation computer program for making and remaking decisions during circuit test propagation (fanout) which require different decision information than decisions made and remade during block processing (test, justify, and transmit). The method also allows for introducing new block functions which require additional new decision information.

(Image Omitted)

Referring to Fig. 1, a flow chart of the method is set forth. The basic definition for each decision type is: FANOUT: Makes and remakes decisions in terms of the

output of

the block with the test value and the go to

block for

that output.

TEST: Calls various behaviors which make or remake

decisions

based on their test (assign block input values

which

produce a test value on the block output for the

fault)

requirement.

JUSTIFY: Calls various behaviors which make or remake

decisions

based on their justify (assign block input

values which produce the desired block output

values) requirement.

TRANSMIT: Calls various behaviors which make or remake

decisions

based on their transmit (assign other block

inputs

which produce a test value on the block

output as a

result of some test value on the block

input) require ment.

The following explanation of the decision structure shows its flexibility. The master decision list contains entries in a linked list, each of which gives the master decision number, the decision type, and other decision information as shown.

(Image Omitted)

Fig. 2 shows a cross reference for each decision type and each behavior which has a structure related to it. It also includes the functions for each behavior.

Each behavior decision is an entry in a particular behavior's linked list. It contains the master decision number which relates to the corresponding master

1

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decision list entry, the decision numbers related to this particular behavior, and other decision information. Each behavior's linked list decision entry is described in turn.

(Image Omitted)

fanout decision 1: Block output number of test value to be propagat ed. fanout decision 2: Go to number of block output of test value to be propagated.

TEST: MOAI decision 1: CMOS exclusive transition fault - Denotes good machine value on non-exclusive input. All other faults - Input containing good machine assigned value.

MOAI decision 2: CMOS exclusive transition fault - Denotes fault machine value on non-exclusive input. All other faults - Input containing fault machine assigned value.

MOAI decision 3: CMOS exclusive transition fault - Exclusive input containing good machine value. All other faults - Not used.

MOAI decision 4: CMOS exclusive transition fault - Exclusive input containing fault machine value. All other faults - Not used.

JUSTIFY:

MOAI decision 1: Input containing good machine justifying value.

MOAI decision 2: Input containing fault machine justifying value.

MOAI decision 3: Not used. MOAI de...