Browse Prior Art Database

Memory Support Fault-Tolerant Apparatus

IP.com Disclosure Number: IPCOM000036718D
Original Publication Date: 1989-Oct-01
Included in the Prior Art Database: 2005-Jan-29
Document File: 4 page(s) / 128K

Publishing Venue

IBM

Related People

Aichelmann, FJ: AUTHOR

Abstract

A method has been proposed for detecting a single stuck fault within two independent implementations of the same control signal in semiconductor devices. Additionally, the development makes it possible to identify the remaining good signal, abort the current operation, dynamically reconfigure the control path, and re-try the operation. (Image Omitted)

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Memory Support Fault-Tolerant Apparatus

A method has been proposed for detecting a single stuck fault within two independent implementations of the same control signal in semiconductor devices. Additionally, the development makes it possible to identify the remaining good signal, abort the current operation, dynamically reconfigure the control path, and re-try the operation.

(Image Omitted)

Under conventional procedures control signals within memory array cards are usually not covered by fault-tolerant methods, as are the actual array chips. When a fault occurs in a control path, the system usually fails and is unusable until the card is replaced.

The proposal suggests a means to reconfigure clocking failures which requires only two copies of the control signal. A conventional memory system is depicted in Fig. 1, with a block diagram of the proposed support circuit provided in Fig. 2. This utilizes two copies of the control signals for memory arrays. The Fault Detection Network (FDN) for the two paths consists of multiple detection apparatus (Fig.

(Image Omitted)

3). The first uses copy 2 as a master for the comparison of copy 1, while the second uses copy 1 as a master to compare copy 2. The detection apparatus (Fig. 4) consists of three stages of latches, D or polarity hold latches. The first operates in a toggle, or divide/ count, mode, while the second and third shift the toggle latch output which results in a true and complement set of outputs.

A failure of...