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Method for Monitoring Grain Size for a Metal Substrate Material

IP.com Disclosure Number: IPCOM000037663D
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-29
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Blackwell, KJ: AUTHOR

Abstract

This method enables the detection of defective areas in a web of substrate material which has developed because of substrate overheating or contamination. During the Vacuum Metalization Process, heat generated is removed by the use of a cold drum. Any area of a metal coating which is not in good mechanical contact with the cold drum, therefore, will become hot, causing it to exhibit large grains in those areas. The areas of larger grain size will have a rougher surface than those areas that are kept cooler.

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Method for Monitoring Grain Size for a Metal Substrate Material

This method enables the detection of defective areas in a web of substrate material which has developed because of substrate overheating or contamination. During the Vacuum Metalization Process, heat generated is removed by the use of a cold drum. Any area of a metal coating which is not in good mechanical contact with the cold drum, therefore, will become hot, causing it to exhibit large grains in those areas. The areas of larger grain size will have a rougher surface than those areas that are kept cooler.

In accordance with this method, a light is transmitted onto the areas of the metal coating on a substrate material, which will be reflected by the smooth surface (the cool/non-contaminated areas) but will be diffused by the rough surface (the overheated/contaminated areas). The reflected light intensity is detected, and the output from such detector is proportional to the reflected light intensity. The drawing illustrates the principles involved.

In the drawing, the numeral 1 is a detector, the numeral 2 is a beam splitter, the numeral 3 is a laser light source, the numeral 4 is the transmitted beam and the numeral 5 illustrates the reflected beam that is reflected from the metal surface for detection by the detector 1.

Disclosed anonymously.

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