Browse Prior Art Database

Decoupling Capacitor Parallel Test Program

IP.com Disclosure Number: IPCOM000037680D
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-29
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Embrey, DR: AUTHOR

Abstract

This article describes an improved method of electrically testing decoupling capacitors after terminal metals.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 1

Decoupling Capacitor Parallel Test Program

This article describes an improved method of electrically testing decoupling capacitors after terminal metals.

The prior art method for testing decoupling capacitors required 20 separate tests requiring an average of four second per device. Each device had four capacitors each of which required five different electrical tests.

The improved method for testing decoupling capacitors requires four separate tests, rather than 20, reducing electrical test time to an average of 1.6 seconds per device. Under the new method, the four capacitors are connected in parallel by the test program software. An internal test limits for continuity, capacitance, dissipation, and leakage are set in the program to simultaneously check the four capacitors. If the limits are not met, the device is rejected. FIG. 1 illustrates the process flow diagram of the test software.

Grouping the capacitors reduces the overall test time decreasing manpower and test equipment costs.

Disclosed anonymously.

1