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Processor Testing Method Using Electrostatic Discharge Apparatus to Stress the Processor and Microprogram to Limit the Test to a Specific Component

IP.com Disclosure Number: IPCOM000038069D
Original Publication Date: 1989-Oct-01
Included in the Prior Art Database: 2005-Jan-31
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Wu, CY: AUTHOR

Abstract

A processor is tested by executing a set of instructions that operate gates in a selected part of the processor while an electrostatic discharge device is operated. Components that might pass other tests but fail after extended normal use often are detected in this test. The test is sufficiently reliable that it is useful to execute special microcode routines that test a particular component such as a single chip. Other stress mechanisms can be used; for example, the processor clock rate can be increased. A sequence of tests with different stress mechanisms can be programmed to execute automatically.

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Processor Testing Method Using Electrostatic Discharge Apparatus to Stress the Processor and Microprogram to Limit the Test to a Specific Component

A processor is tested by executing a set of instructions that operate gates in a selected part of the processor while an electrostatic discharge device is operated. Components that might pass other tests but fail after extended normal use often are detected in this test. The test is sufficiently reliable that it is useful to execute special microcode routines that test a particular component such as a single chip. Other stress mechanisms can be used; for example, the processor clock rate can be increased. A sequence of tests with different stress mechanisms can be programmed to execute automatically.

Disclosed anonymously.

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