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High Speed, Self-Adjusting Data Storage Test

IP.com Disclosure Number: IPCOM000038414D
Original Publication Date: 1987-Jan-01
Included in the Prior Art Database: 2005-Jan-31
Document File: 1 page(s) / 12K

Publishing Venue

IBM

Related People

Day, MN: AUTHOR [+3]

Abstract

This article describes a method to continue testing of storage after a bad word is found by self-adjusting the parameters and a method to speed up the test process. In accordance with the new method, a test routine is used with input parameters giving the starting address and size of storage to be tested. Testing is done in 64K blocks instead of 8K blocks. A high speed storing and scanning loop is used (arrows indicate register loading), as indicated below: The starting address and number of words in the block are set from the initial parameters before the high speed store and scan are done. The register CX defines how many words are to be repeatedly stored and scanned. It gets decremented with each word operation. The store and scan stops when it equals zero. The register AX has the pattern to store and scan for.

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High Speed, Self-Adjusting Data Storage Test

This article describes a method to continue testing of storage after a bad word is found by self-adjusting the parameters and a method to speed up the test process. In accordance with the new method, a test routine is used with input parameters giving the starting address and size of storage to be tested. Testing is done in 64K blocks instead of 8K blocks. A high speed storing and scanning loop is used (arrows indicate register loading), as indicated below: The starting address and number of words in the block are set from the initial parameters before the high speed store and scan are done. The register CX defines how many words are to be repeatedly stored and scanned. It gets decremented with each word operation. The store and scan stops when it equals zero. The register AX has the pattern to store and scan for. The scan instruction will compare each word with the pattern in AX and continue scanning until a value is found unequal to AX. The zero flag is reset, and the next instruction will cause an exit out of the loop. Normally, the test routine would be exited at this point. With this new routine, the jump to ERROR results in additional processing to finish the pattern testing. First, ES:DI is checked to see if it is the first word that failed. If not, the AX is checked to see if the last pattern has been run through. If either one of these is true, the routine is exited. Otherwise, the initial number of words in t...