Browse Prior Art Database

Interposer Carrier

IP.com Disclosure Number: IPCOM000038507D
Original Publication Date: 1987-Jan-01
Included in the Prior Art Database: 2005-Jan-31
Document File: 2 page(s) / 42K

Publishing Venue

IBM

Related People

Sarachinsky, B: AUTHOR [+2]

Abstract

An interposer holds spring probes in the proper position to establish an electrical connection between a printed circuit board (PCB) and a test head for a product handling shorts and opens test machine. As typically implemented, the spring probes are susceptible to damage and falling out of the interposer while being transported. The placing of the interposer into a carrier prevents these problems, as described below. As seen in Fig. 1, in the Section A-A view, the spring probes 1 are slip-fitted into the drilled holes 2 of a top frame 3 of the interposer 4. The probes 1 extend down to and through the drilled holes 5 of a bottom frame 6. The interposer 4 is an assembly and consists of a top frame 3 and a bottom frame 6 which are separated by a spacer 7.

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Interposer Carrier

An interposer holds spring probes in the proper position to establish an electrical connection between a printed circuit board (PCB) and a test head for a product handling shorts and opens test machine. As typically implemented, the spring probes are susceptible to damage and falling out of the interposer while being transported. The placing of the interposer into a carrier prevents these problems, as described below. As seen in Fig. 1, in the Section A-A view, the spring probes 1 are slip-fitted into the drilled holes 2 of a top frame 3 of the interposer 4. The probes 1 extend down to and through the drilled holes 5 of a bottom frame 6. The interposer 4 is an assembly and consists of a top frame 3 and a bottom frame 6 which are separated by a spacer 7. The interposer assembly is held together by recessed flathead screws 8 that secure to the threaded holes 9 in spacer 7. Bottom contact ends 10 of probes 1 make electrical contact with the PCB (not shown) and a top contact end 11 makes electrical contact with a test head (not shown) which is wired to an electronic switching matrix (not shown) to provide the electrical connection needed to test the PCB. The probes 1 are constructed such that the bottom contact end 10 of probe 1 recesses into a spring-loaded cavity 12. When the interposer 4 is placed between the test head and the PCB, the spring (not seen) is placed under compression which forces probes 1 to make a firm contact with the PCB. The pr...