Browse Prior Art Database

Electronic Circuit Card Extender for in Situ Testing

IP.com Disclosure Number: IPCOM000039240D
Original Publication Date: 1987-May-01
Included in the Prior Art Database: 2005-Feb-01
Document File: 2 page(s) / 85K

Publishing Venue

IBM

Related People

Bush, KB: AUTHOR [+3]

Abstract

The testing of card circuit nodes in a zero-insertion-force (ZIF) type of electronic circuit package, in which the nodes are recessed, is more easily accomplished using an extender. The testing is performed during machine operation, and the extender must be designed such that the probing is done without introducing excessively high coupled signal noise. A card extender which accomplishes these objectives works in the following manner. (Image Omitted) As seen in Fig. 1, a printed circuit card 1 to be tested has connector contacts 2 for insertion into ZIF connectors 3 in a shoe-box frame 4. The card to be tested must be extended outside the frame in order to provide access for probing during system test, but the extension method must not introduce additional system noise which might adversely affect system operation.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 56% of the total text.

Page 1 of 2

Electronic Circuit Card Extender for in Situ Testing

The testing of card circuit nodes in a zero-insertion-force (ZIF) type of electronic circuit package, in which the nodes are recessed, is more easily accomplished using an extender. The testing is performed during machine operation, and the extender must be designed such that the probing is done without introducing excessively high coupled signal noise. A card extender which accomplishes these objectives works in the following manner.

(Image Omitted)

As seen in Fig. 1, a printed circuit card 1 to be tested has connector contacts 2 for insertion into ZIF connectors 3 in a shoe-box frame 4. The card to be tested must be extended outside the frame in order to provide access for probing during system test, but the extension method must not introduce additional system noise which might adversely affect system operation. In the testing method described, a card extender frame 5 (Fig.
2) is used to form a rigid member between the printed circuit card 1 to be tested and an extender card 9 which has connector contacts 12 for insertion into the ZIF connectors 3 (Fig. 1). This extender card includes short printed circuit line segments between the connector contacts 12 and plated holes 6 for the attachment of flexible printed circuit cables 11 which connect the system signal and power lines to extended ZIF connectors 8. The card to be tested 1 is inserted into these extended ZIF connectors. The extender card 9 and the flexi...