Browse Prior Art Database

Probe and Slide Assembly

IP.com Disclosure Number: IPCOM000040207D
Original Publication Date: 1987-Oct-01
Included in the Prior Art Database: 2005-Feb-02
Document File: 2 page(s) / 63K

Publishing Venue

IBM

Related People

Blair, EA: AUTHOR [+4]

Abstract

This article describes a mechanism comprising two assemblies (a probe assembly and a slide assembly) that work in conjunction with each other for simultaneously testing up to 12,000 contacts on the top surface of a substrate. The slide assembly is utilized in two sets (LH) and (RH) of two slides each via a tooling change as a function of the product family under test e.g., 64 mm, 90 mm, etc. For this test the substrate is thought of as having four separate quadrants. (Image Omitted) The four probe assemblies are shown at 1 in the isometric view of Fig. 1. Each houses probe test contacts. The four slide assemblies are shown in detail at 2 in the isometric view of Fig. 2. Each slide carries and positions the four probe assemblies.

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Probe and Slide Assembly

This article describes a mechanism comprising two assemblies (a probe assembly and a slide assembly) that work in conjunction with each other for simultaneously testing up to 12,000 contacts on the top surface of a substrate. The slide assembly is utilized in two sets (LH) and (RH) of two slides each via a tooling change as a function of the product family under test e.g., 64 mm, 90 mm, etc. For this test the substrate is thought of as having four separate quadrants.

(Image Omitted)

The four probe assemblies are shown at 1 in the isometric view of Fig. 1. Each houses probe test contacts. The four slide assemblies are shown in detail at 2 in the isometric view of Fig. 2. Each slide carries and positions the four probe assemblies. In the case of the probe assembly a cluster of buckling beam probes are positioned and constrained within the housing of the assembly. To protect the probe ends that protrude from the bottom of the assembly, a spring- loaded down stripper plate (not shown) is used and deflects upward during test so as not to inhibit probe and substrate contact. The slide assembly 2 provides location and mounting of the probe assembly 1 by means of the posts 3 (Fig. 2) of the slide assembly. The slides travel on a line and move equidistant in relation to one another from each corner to the center of the substrate. Bidirectional slide

(Image Omitted)

travel is provided by the slide assembly encoded gear box drive 4, shown in detail...