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Alignment of Substrates for Testing

IP.com Disclosure Number: IPCOM000041009D
Original Publication Date: 1987-May-01
Included in the Prior Art Database: 2005-Feb-02
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Beaumont, GD: AUTHOR

Abstract

A technique is described for accurately positioning substrates in a test environment so that electrical tests can be performed at all points on the substrate.

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Alignment of Substrates for Testing

A technique is described for accurately positioning substrates in a test environment so that electrical tests can be performed at all points on the substrate.

In the manufacture of substrates, all of the points on a substrate must be tested at the same time. This entails bringing a test probe having wire probes into contact with each of the points. Due to the small dimensions and physical tolerances of the wire probes and the points on the substrates, the alignment of the probes with the points can be difficult and tedious.

It is known that the largest variations in positioning of the points on the substrates occur at those points which are located at the outer edges of the substrate. A prism or beam splitter can be used to create an image on a video monitor of the points located at the four corners of a substrate. Initially, a permanent target image is created on the monitor corresponding to the four corner wires of the test probe using the same monitor and the beam splitter. An operator can then readily and accurately locate a substrate to be tested by aligning the image of the four corner points of the substrate with the permanent image of the corners of the test probe on the monitor for each substrate. Minor positional changes of the substrate with respect to the permanent target image can be readily made in the x, y or rotational directions.

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