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Four-Terminal Resistance Probe Arrangement

IP.com Disclosure Number: IPCOM000041013D
Original Publication Date: 1987-May-01
Included in the Prior Art Database: 2005-Feb-02
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Bossi, E: AUTHOR [+2]

Abstract

An L-shaped probe and tuning fork type of connector can be connected to permit four-terminal resistance measurements of a suspect circuit contact between a card and board without disturb- ing the contact.

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This is the abbreviated version, containing approximately 100% of the total text.

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Four-Terminal Resistance Probe Arrangement

An L-shaped probe and tuning fork type of connector can be connected to permit four-terminal resistance measurements of a suspect circuit contact between a card and board without disturb- ing the contact.

In the figure, circuit card 1 carrying components 2 and having spring contacts 3 is installed between conductive pins 4 extending through board 5. Resistance measurement of the current path between a spring contact 3 and its mating pin 4 is made by means of a four point probe. One probe terminal comprises L- shaped insulator block 6 carrying two conductors 7A, 7B on its surface that each attach to a respective one of a pair of cur- rent-voltage terminals of a milliohmeter (not shown). Connector 8 of the tuning fork type is a second probe and is modified to form two separate halves 8A, 8B each contacting the lower exten- sion of pin 4. The two connector halves are each connective to respective ones of a second pair of current-voltage terminals on the meter. These probes permit testing of an installed card/board contact without interference or requiring removal of the card, and thus destroying a suspect contact. When plural cards 1 are mounted to board 5 in a planar parallel relationship, the L-shaped probe provides access to the contacts 3 and clear- ance of the surface mounted component.

(Image Omitted)

Disclosed anonymously

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