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Universal Nodal Test Fixture for Electronic Card Assemblies

IP.com Disclosure Number: IPCOM000041093D
Original Publication Date: 1987-Jul-01
Included in the Prior Art Database: 2005-Feb-02
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Deeg, WE: AUTHOR

Abstract

A test fixture for testing electronic circuit card assemblies is provided with means to accommodate engineering changes without having to make expensive modifications to the test fixture. The means by which this is accomplished is to pre-drill the fixture to the maximum possible circuit hole pattern which the electronic card assembly could ever utilize. Tester probe pins are either added or deleted depending upon the particular hole pattern used in the design of the card assembly.

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Universal Nodal Test Fixture for Electronic Card Assemblies

A test fixture for testing electronic circuit card assemblies is provided with means to accommodate engineering changes without having to make expensive modifications to the test fixture. The means by which this is accomplished is to pre-drill the fixture to the maximum possible circuit hole pattern which the electronic card assembly could ever utilize. Tester probe pins are either added or deleted depending upon the particular hole pattern used in the design of the card assembly.

Figure 1 shows card fixture generally shown at 10 comprised of upper plate member 11 and lower plate member 12 provided with a plurality of drill holes 17, which receive probe 14 and receptacle 13 as shown in Figure 2. Figure 3 shows upper plate member 17 receiving electronic card assembly 15, plate member 12 receiving plate member 11, and fixture wiring interface frame 16 receiving plate member 13. Fixture 10, also termed "bed of nails", via probe 14 and receptacle 13, provides electrical continuity from the circuit side of card 15 to test circuitry external to frame 16. Engineering changes to card 15 are easily tested by merely adding or deleting test probes 14 to holes 17 on lower plate 12; prior art required upper and lower plates 11 and 12 to be drilled to match the circuitry of card 15 being tested.

Disclosed anonymously.

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