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Packaging Technique for an Automated Test Cell

IP.com Disclosure Number: IPCOM000041183D
Original Publication Date: 1987-Nov-01
Included in the Prior Art Database: 2005-Feb-02
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Cook, WG: AUTHOR [+2]

Abstract

This test cell is used for environmental stress testing of logic units. The design is versatile enough to be used as a manually loaded station, or it can be fully automated.

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Packaging Technique for an Automated Test Cell

This test cell is used for environmental stress testing of logic units. The design is versatile enough to be used as a manually loaded station, or it can be fully automated.

The test cell is shown in an open position. The pallet 10 is being loaded from left to right into the test cell.

The test cell chamber 12 moves up and down on four guide posts 13. This movement is accomplished with two air cylinders 14. The device 15 to be tested has previously been placed on the pallet 11 and cabled to the pallet connector
16.

Connector 17 is the mating electrical connection on the test cell. The connector is aligned by the two guide pins 18.

Air is forced through the test cell via inlet 22 and outlet (not shown) on the back of the test cell. Rubber seals 20 and 21 close off air flow around the outside of device 15 so that the air flow is forced through the device 15.

The temperature of the air flow may be raised or lowered to stress device 15 under test.

Disclosed anonymously.

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