Browse Prior Art Database

Testing the Adhesion of Thin Layers on Substrates

IP.com Disclosure Number: IPCOM000041929D
Original Publication Date: 1984-Mar-01
Included in the Prior Art Database: 2005-Feb-03
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Meyer, DW: AUTHOR [+2]

Abstract

The well-known Vicker's hardness test is modified to allow the adhesion of thin, transparent, non-ductile layers on substrates to be rapidly classified and used as feedback during their production. Modification of the Vicker's test is achieved by increasing the diamond force beyond the forces generally applied to a value at which the shearing forces between layer and substrate cause a variety of effects, such as diamond imprints, cracks at the diamond corners, and a circular layer separation recognizable as interference fringes.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 1

Testing the Adhesion of Thin Layers on Substrates

The well-known Vicker's hardness test is modified to allow the adhesion of thin, transparent, non-ductile layers on substrates to be rapidly classified and used as feedback during their production. Modification of the Vicker's test is achieved by increasing the diamond force beyond the forces generally applied to a value at which the shearing forces between layer and substrate cause a variety of effects, such as diamond imprints, cracks at the diamond corners, and a circular layer separation recognizable as interference fringes.

1