Browse Prior Art Database

Thin Film Light Enhancement

IP.com Disclosure Number: IPCOM000042489D
Original Publication Date: 1984-May-01
Included in the Prior Art Database: 2005-Feb-03
Document File: 2 page(s) / 53K

Publishing Venue

IBM

Related People

Puterbaugh, LJ: AUTHOR [+3]

Abstract

Light is projected along the three orthogonal axes of a substrate bearing a translucent thin organic film to enhance visibility of the film for measuring purposes using optical microscopy. It is particularly useful for measuring thin polyimide layers in the micron range which are spray coated on circuitized ceramic substrates. A sectioned sample S (Fig. 1) of the circuitized ceramic substrate 1 (Fig. 2) is encapsulated in a transparent cylindrically shaped epoxy member E. Sample S has an organic film 6, and the bottom edge 2 of sample S is oriented normal to the optical axis Z of a high power, e.g., 1000x, photographic measuring microscope (not shown). Coincident with axis Z is the light from a high intensity, e.g.

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Thin Film Light Enhancement

Light is projected along the three orthogonal axes of a substrate bearing a translucent thin organic film to enhance visibility of the film for measuring purposes using optical microscopy. It is particularly useful for measuring thin polyimide layers in the micron range which are spray coated on circuitized ceramic substrates. A sectioned sample S (Fig. 1) of the circuitized ceramic substrate 1 (Fig. 2) is encapsulated in a transparent cylindrically shaped epoxy member E. Sample S has an organic film 6, and the bottom edge 2 of sample S is oriented normal to the optical axis Z of a high power, e.g., 1000x, photographic measuring microscope (not shown). Coincident with axis Z is the light from a high intensity, e.g., tungsten filament, light source (not shown), and which is transmitted through fiber- optic cable A, that illuminates the upper edge 3 of sample S. Auxiliary high intensity, e.g., tungsten filament, light sources (not shown) transmit light through fiber-optic cables B and C along axes Y and X, respectively, and illuminates the sample S normal to its side edge 4 and normal to its surface 5. As shown in the resultant photomicrograph (Fig. 2), the thin organic film 6 atop the evaporated circuit copper 7 on the substrate 1 is more readily distinguished and hence measurable than in the case where only the one source associated with cable A was used.

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