Browse Prior Art Database

Non-Contact Sensor for Oxide Data Disks

IP.com Disclosure Number: IPCOM000042595D
Original Publication Date: 1984-Jun-01
Included in the Prior Art Database: 2005-Feb-04
Document File: 2 page(s) / 26K

Publishing Venue

IBM

Related People

Goshey, J: AUTHOR [+2]

Abstract

Oxide data disks contain many thin layers of different materials. For example, a current disk has (counting out from the aluminum alloy substrate) (1) a sealing coating, (2) magnetic coating to sealing coating interface, (3) bulk magnetic coating, (4) buffed coating to air interface, and (5) lubricant. Each of these interfaces contains charge layers corresponding to the respective work functions of the materials and their state of mechanical/electrical stress. It has been determined that the interfacial (and perhaps bulk) charges at every disk-making process can be detected, and their uniformity is a clear indicator of the oxide uniformity of the final finished disk. The charges on the disk can be detected by the non-contact charge probe shown in the figure. Typical component values are shown.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 2

Non-Contact Sensor for Oxide Data Disks

Oxide data disks contain many thin layers of different materials. For example, a current disk has (counting out from the aluminum alloy substrate) (1) a sealing coating, (2) magnetic coating to sealing coating interface, (3) bulk magnetic coating, (4) buffed coating to air interface, and (5) lubricant. Each of these interfaces contains charge layers corresponding to the respective work functions of the materials and their state of mechanical/electrical stress. It has been determined that the interfacial (and perhaps bulk) charges at every disk-making process can be detected, and their uniformity is a clear indicator of the oxide uniformity of the final finished disk. The charges on the disk can be detected by the non-contact charge probe shown in the figure. Typical component values are shown. Thus configured, the probe detects charge, from a distance of several hundred micrometers, with a bandwidth from 0.2 to 150 KHz. The high resolution and speed of this probe permits automatic disk scanning throughout the process line.

1

Page 2 of 2

2

[This page contains 2 pictures or other non-text objects]