Browse Prior Art Database

Device Carrier, Movement and Test System

IP.com Disclosure Number: IPCOM000042635D
Original Publication Date: 1984-Jun-01
Included in the Prior Art Database: 2005-Feb-04
Document File: 2 page(s) / 36K

Publishing Venue

IBM

Related People

Lusk, SD: AUTHOR

Abstract

In the existing chip-handling machines for semiconductor testers, a significant amount of wastage is incurred through misoriented chips, edge chipping and cracking due to excessive chip handling by the apparatus. These problems of chip wastage are solved by the device carrier, movement, and test system invention disclosed and illustrated in this article. The figure illustrates a top or plan view of the invention. A carrier block 11 contains 13 rows of chips, each row containing 30 chips. Each row is labeled 12, as shown. The carrier block 11 is mounted on a linear displacement track so as to advance along the axial direction 13, sequentially positioning each row 12 of chips in front of the air jet or linear ram 14.

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Device Carrier, Movement and Test System

In the existing chip-handling machines for semiconductor testers, a significant amount of wastage is incurred through misoriented chips, edge chipping and cracking due to excessive chip handling by the apparatus. These problems of chip wastage are solved by the device carrier, movement, and test system invention disclosed and illustrated in this article. The figure illustrates a top or plan view of the invention. A carrier block 11 contains 13 rows of chips, each row containing 30 chips. Each row is labeled 12, as shown. The carrier block 11 is mounted on a linear displacement track so as to advance along the axial direction 13, sequentially positioning each row 12 of chips in front of the air jet or linear ram 14. The air jet or linear ram 14 will sequentially advance a juxtaposed row 12 of the chips so that each respective chip is sequentially moved along the carrier track 15 and deposited on the belt 16. Each chip 17 so deposited on the belt 16 will be oriented in a predetermined orientation by means of the end stop
23. The belt 16 engages in a step-wise motion and stop movement so that sufficient space is left between each respective chip 17 deposited from the carrier track 15 onto the belt 16, so as to enable clearance under the contactor frame 18 for the electrodes 19 of the tester. The structure and operation of the invention as described thus far illustrates an important principle underlying the invention, which is...