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Browse Prior Art Database

Robot Mechanism for Two Simultaneous Displacements

IP.com Disclosure Number: IPCOM000042823D
Original Publication Date: 1984-Jun-01
Included in the Prior Art Database: 2005-Feb-04
Document File: 2 page(s) / 39K

Publishing Venue

IBM

Related People

Cavalier, A: AUTHOR [+4]

Abstract

This invention relates to a robot mechanism enabling a probe to be moved to a test point through a single movement. As shown in the figure, the probe is fixedly mounted on a movable arm AB hinged on the ends of arm MA pivoting about M and arm NB pivoting about N. The mechanism is driven by a motor which is program controlled. When the mechanism has reached the desired location, the two arms MA and NB are pivoted downwards so that the probe is vertically positioned at the test point. The length of arms AB, MA and NB has been computed so that the probe is very quickly brought to the vertical position. The gap between the testing end of the probe and the vertical line of the test point is only 0.2 mm when the probe end is 2.5 cm above the test point, and this gap is reduced to 0.

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Robot Mechanism for Two Simultaneous Displacements

This invention relates to a robot mechanism enabling a probe to be moved to a test point through a single movement. As shown in the figure, the probe is fixedly mounted on a movable arm AB hinged on the ends of arm MA pivoting about M and arm NB pivoting about N. The mechanism is driven by a motor which is program controlled. When the mechanism has reached the desired location, the two arms MA and NB are pivoted downwards so that the probe is vertically positioned at the test point. The length of arms AB, MA and NB has been computed so that the probe is very quickly brought to the vertical position. The gap between the testing end of the probe and the vertical line of the test point is only 0.2 mm when the probe end is 2.5 cm above the test point, and this gap is reduced to 0.01 mm when the probe end is 1 cm above the test point. Two probes, and therefore two robot mechanisms, are used to test various parameters, such as the impedance and electrical continuity between two points on a board. The use of such a robot mechanism applying a single movement to the probe optimizes the speed and reduces mechanical play which would result from two consecutive movements. The movement of the mechanism with the probes in the up position avoids the contentions which would result from a movement with the probes in the down position.

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