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Yield Model for Yield Planning

IP.com Disclosure Number: IPCOM000043127D
Original Publication Date: 1984-Jul-01
Included in the Prior Art Database: 2005-Feb-04
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Stapper, CH: AUTHOR

Abstract

Read-only memory chip yields can be accurately projected by the number of circuits using the formula Y = Yo (1 + n g/a)-a, where n is the number of bits per chip, g is the average number of faults per bit, Yo is a gross yield factor, and a is a defect clustering parameter.

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Yield Model for Yield Planning

Read-only memory chip yields can be accurately projected by the number of circuits using the formula Y = Yo (1 + n g/a)-a, where n is the number of bits per chip, g is the average number of faults per bit, Yo is a gross yield factor, and a is a defect clustering parameter.

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