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Optical Fiber Study With Scanning Electron Microscope

IP.com Disclosure Number: IPCOM000044292D
Original Publication Date: 1984-Dec-01
Included in the Prior Art Database: 2005-Feb-05
Document File: 1 page(s) / 12K

Publishing Venue

IBM

Related People

Bailey, PJ: AUTHOR [+4]

Abstract

The scanning electron microscope (SEM) can be used to study the transmission characteristics of optical fibers, and to locate certain types of defects in the fibers. The glass fiber is coated with a thin cathodoluminescent layer, after which the far end of the fiber is coupled to a photomultiplier. During examination in the SEM, the sample is scanned by a fine electron beam, which gives a localized source of light on the surface of the sample at the point of impact of the electron beam. The quantity of light that is transmitted along the fiber to the photomultiplier will determine the brightness of that particular pixel (picture element) in the recorded image. This gives a luminescent image in which the optical fiber forms an essential part of the collector system.

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Optical Fiber Study With Scanning Electron Microscope

The scanning electron microscope (SEM) can be used to study the transmission characteristics of optical fibers, and to locate certain types of defects in the fibers. The glass fiber is coated with a thin cathodoluminescent layer, after which the far end of the fiber is coupled to a photomultiplier. During examination in the SEM, the sample is scanned by a fine electron beam, which gives a localized source of light on the surface of the sample at the point of impact of the electron beam. The quantity of light that is transmitted along the fiber to the photomultiplier will determine the brightness of that particular pixel (picture element) in the recorded image. This gives a luminescent image in which the optical fiber forms an essential part of the collector system. Thus, the central core in the fiber will appear bright in the image, as determined by its optical transmission properties. The transmission efficiency of the core can be examined with respect to its uniformity and with respect to whether modes are present. Points can be located on the outer surface of the fiber from which light can enter the core. It should also be possible to study the frequency response of the fiber as a function of the position within the core by pulsing the electron beam. As an example of the application of this technique, a scintillator was removed from the wide-angle scintillator backscattered electron (BSE) detector of a comm...