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System for Representing Characteristic Information of Image Pattern

IP.com Disclosure Number: IPCOM000044574D
Original Publication Date: 1984-Dec-01
Included in the Prior Art Database: 2005-Feb-06
Document File: 2 page(s) / 52K

Publishing Venue

IBM

Related People

Miyazaki, H: AUTHOR

Abstract

For saving the capacity of pattern memory which stores characteristic information of the reference image patterns in an image-handling machine such as a seal verification device or a pattern recognition device, the characteristic information is composed of only some selected horizontal and vertical scan lines of the image pattern and represented by the ratio of the spacings between the pattern lines across the selected horizontal and vertical scan lines to the width and height of the pattern. Referring to the figure, each character or pattern may be represented by m horizontal scan lines and n vertical scan lines and characterized by only some selected horizontal and vertical scan lines of, for example, the Kanji character H1, H5, V2 and V3.

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System for Representing Characteristic Information of Image Pattern

For saving the capacity of pattern memory which stores characteristic information of the reference image patterns in an image-handling machine such as a seal verification device or a pattern recognition device, the characteristic information is composed of only some selected horizontal and vertical scan lines of the image pattern and represented by the ratio of the spacings between the pattern lines across the selected horizontal and vertical scan lines to the width and height of the pattern. Referring to the figure, each character or pattern may be represented by m horizontal scan lines and n vertical scan lines and characterized by only some selected horizontal and vertical scan lines of, for example, the Kanji character H1, H5, V2 and V3. Each of the scan lines is represented by the ratio of spacings between the black areas in the pattern to its whole width "W" or height "L". That is, the horizontal scan line Hi is represented by (Wi1/W, Wi2/W, ...Wip/W), and the vertical scan line Vj is represented by (Lj1/L, Lj2/L ... Ljq/L). This enables the scan line to be represented regardless of the size of the pattern. In case this technique is used in the seal verification device, the characteristic information composed of only the selected scan lines of the reference pattern is stored in the pattern memory and compared with scan data of the corresponding lines in a pattern to be verified for checking...